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Connecting pre-silicon and post-silicon verification.

Sandip RayWarren A. Hunt Jr.
Published in: FMCAD (2009)
Keyphrases
  • low cost
  • high speed
  • high density
  • neural network
  • silicon dioxide
  • gallium arsenide
  • databases
  • multiscale
  • fingerprint verification
  • semiconductor devices
  • plasma etching