Special issue: British Machine Vision Conference 1993.
John IllingworthPublished in: Image Vis. Comput. (1994)
Keyphrases
- machine vision
- special issue
- ai edam
- image processing
- vision system
- character recognition
- quality control
- selected papers
- international journal
- computer society
- advances in artificial intelligence
- imaging systems
- ecml pkdd
- computer vision
- surface inspection
- applied intelligence
- special section
- papers included
- international conference
- automated visual inspection
- program committee
- invited talk
- artificial neural networks
- real time