Meta-heuristics for Circuit Partitioning in Parallel Test Generation.
Consolación GilJulio OrtegaAntonio F. DíazMaria Dolores Gil MontoyaPublished in: IPPS/SPDP Workshops (1998)
Keyphrases
- metaheuristic
- test generation
- simulated annealing
- tabu search
- optimization problems
- ant colony optimization
- search space
- test cases
- combinatorial optimization
- optimal solution
- design automation
- combinatorial optimization problems
- symbolic execution
- search methods
- combinatorial problems
- test sequences
- genetic algorithm
- software testing
- static analysis
- specific problems
- nature inspired
- particle swarm optimization
- quality assurance
- vehicle routing problem
- parallel computing
- simulated annealing and tabu search
- set of benchmark instances
- circuit design
- benchmark instances
- cost function
- processing times
- traveling salesman problem
- software development
- evolutionary algorithm
- artificial intelligence