Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies.
Licai HaoXinyi ZhangChenghu DaiQiang ZhaoWenjuan LuChunyu PengYongliang ZhouZhiting LinXiulong WuPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2024)