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Circuit design and experimental test of a high power IGBT non-destructive tester.

Ashraf AhmedAlberto CastellazziL. CoulbeckM. C. Johnson
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • circuit design
  • high power
  • low power
  • test cases
  • real time
  • fuzzy logic
  • fault diagnosis
  • high density