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An innovative die to wafer 3D integration scheme: Die to wafer oxide or copper direct bonding with planarised oxide inter-die filling.

Léa Di CioccioPierric GueguenRachid TaibiThomas SignamarcheixLaurent BallyLaurent VandrouxMarc ZussySophie VerrunJérôme DechampPatrick LeducMyriam AssousDavid BouchuFrançois de CrecyLaurent-Luc ChapelonLaurent Clavelier
Published in: 3DIC (2009)
Keyphrases
  • integrated circuit
  • three dimensional
  • detection scheme
  • semiconductor manufacturing
  • databases
  • fuel cell
  • silicon dioxide
  • metal oxide