Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults.

Yu-Chiun Lin Shi-Yu Huang

Published in: J. Electron. Test. (2006)

Keyphrases

multiple faults
fault diagnosis
low cost
high speed
computationally efficient
high accuracy
expert systems
physical design
high quality
medical diagnosis
discrete event
analog vlsi
multi agent systems
cooperative
data sets
highly accurate
high density
decision making