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Electron Radiation Effects on the 4H-SiC PiN Diodes Characteristics: An Insight From Point Defects to Electrical Degradation.

Peng DongYazhou QinXuegong YuXingliang XuZhe ChenLiang-Hui LiYingxin Cui
Published in: IEEE Access (2019)
Keyphrases
  • electrical properties
  • infrared
  • x ray
  • physical characteristics
  • real time
  • high density
  • image processing
  • power grid
  • defect classification