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Estimation of fault-free leakage current using wafer-level spatial information.
Sagar S. Sabade
D. M. H. Walker
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2006)
Keyphrases
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spatial information
spatial distribution
spatial relationships
temporal information
intensity values
spatial relations
local binary pattern
region connection calculus
visual words
fault diagnosis
color distribution
spatial context
computer vision
video camera
color histogram