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Extended frequency-directed run-length code with improved application to system-on-a-chip test data compression.

Aiman H. El-MalehRaslan H. Al-Abaji
Published in: ICECS (2002)
Keyphrases
  • test data
  • run length
  • training data
  • test cases
  • run length encoding
  • test set
  • data sets
  • gray level
  • compression scheme
  • compression rate
  • computer vision
  • image segmentation
  • multiresolution
  • error rate
  • data compression