Automated line flattening of Atomic Force Microscopy images.
Sotirios A. TsaftarisJana ZujovicAggelos K. KatsaggelosPublished in: ICIP (2008)
Keyphrases
- image data
- input image
- ground truth
- image features
- image collections
- image classification
- image database
- three dimensional
- atomic force microscopy
- image analysis
- multiple images
- fully automatic
- fully automated
- image annotation
- image set
- lighting conditions
- test images
- image registration
- edge detection
- object recognition
- segmentation algorithm
- image processing
- segmentation method
- automated segmentation
- image retrieval
- illumination conditions
- feature points
- computer graphics
- single image
- image sequences
- image content
- image matching
- rigid body
- structure from motion
- line features
- line extraction
- spatial information