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Experts
- Faisal Shafait
- Thomas M. Breuel
- Syed Saqib Bukhari
- Basilios Gatos
- Marcus Liwicki
- Josef Kittler
- David S. Doermann
- C. V. Jawahar
- Nam Ik Cho
- Bhabatosh Chanda
- Sekhar Mandal
- Chew Lim Tan
- Andreas Dengel
- Hyung Il Koo
- Muhammad Zeshan Afzal
- Venu Govindaraju
- S. P. Chowdhury
- Jun Sun
- Its'hak Dinstein
- Jihad El-Sana
- Mohamed Cheriet
- Thierry Paquet
- Ram Sarkar
- Jean-Marc Ogier
- Gaofeng Meng
- Gary E. Kopec
- Mita Nasipuri
- Ching Y. Suen
- P. Nagabhushan
- Ioannis Pratikakis
- Chunhong Pan
- Umapada Pal
- Gerd Maderlechner
- Yasuaki Ito
- Alfred M. Bruckstein
- Pierre Héroux
- Nikolaos Stamatopoulos
- Gaurav Harit
- Gady Agam
Venues
- ICDAR
- CoRR
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- Int. J. Document Anal. Recognit.
- ICIP
- IEEE Trans. Image Process.
- Remote. Sens.
- ICASSP
- MVA
- ICFHR
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- Document Analysis Systems
- DRR
- Systems and Computers in Japan
- Sensors
- Image Vis. Comput.
- ICPR (2)
- J. Electronic Imaging
- Int. J. Pattern Recognit. Artif. Intell.
- Document Recognition
- IGARSS
- CVPR
- Comput. Electron. Agric.
- IEEE Geosci. Remote. Sens. Lett.
- Multim. Tools Appl.
- ICIP (2)
- Expert Syst. Appl.
- Comput. Vis. Graph. Image Process.
- DAS
- BMVC
- GREC
- ICCV
- Pattern Anal. Appl.
- ICMV
- ICPR (3)
- ICVGIP
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