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Experts
- Faisal Shafait
- Thomas M. Breuel
- Basilios Gatos
- Syed Saqib Bukhari
- C. V. Jawahar
- Josef Kittler
- Marcus Liwicki
- David S. Doermann
- Sekhar Mandal
- Bhabatosh Chanda
- Nam Ik Cho
- Andreas Dengel
- Chew Lim Tan
- Hyung Il Koo
- Venu Govindaraju
- Jun Sun
- Muhammad Zeshan Afzal
- Mohamed Cheriet
- S. P. Chowdhury
- Its'hak Dinstein
- Jihad El-Sana
- P. Nagabhushan
- Jean-Marc Ogier
- Gary E. Kopec
- Mita Nasipuri
- Ioannis Pratikakis
- Umapada Pal
- Ram Sarkar
- Chunhong Pan
- Gaofeng Meng
- Thierry Paquet
- Ching Y. Suen
- Hiroharu Kawanaka
- Yasuaki Ito
- G. Hemantha Kumar
- Nahum Kiryati
- John Illingworth
- Jonathan J. Hull
- Robert M. Haralick
Venues
- CoRR
- ICDAR
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- Int. J. Document Anal. Recognit.
- ICIP
- IEEE Trans. Image Process.
- IEEE Access
- Remote. Sens.
- ICASSP
- MVA
- ICFHR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Document Analysis Systems
- DRR
- Sensors
- Systems and Computers in Japan
- ICPR (2)
- J. Electronic Imaging
- Image Vis. Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- Document Recognition
- IGARSS
- Multim. Tools Appl.
- Expert Syst. Appl.
- CVPR
- IEEE Geosci. Remote. Sens. Lett.
- ICIP (2)
- Comput. Electron. Agric.
- GREC
- BMVC
- Medical Imaging: Image Processing
- DAS
- Comput. Vis. Graph. Image Process.
- ICVGIP
- Pattern Anal. Appl.
- ICPR (3)
- ICIAR (1)
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