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- Faisal Shafait
- Basilios Gatos
- Syed Saqib Bukhari
- Thomas M. Breuel
- Josef Kittler
- Marcus Liwicki
- David S. Doermann
- C. V. Jawahar
- Nam Ik Cho
- Bhabatosh Chanda
- Sekhar Mandal
- Hyung Il Koo
- Andreas Dengel
- Chew Lim Tan
- Its'hak Dinstein
- Jihad El-Sana
- S. P. Chowdhury
- Muhammad Zeshan Afzal
- Jun Sun
- Venu Govindaraju
- Mohamed Cheriet
- Umapada Pal
- Thierry Paquet
- Chunhong Pan
- P. Nagabhushan
- Jean-Marc Ogier
- Ioannis Pratikakis
- Ching Y. Suen
- Gary E. Kopec
- Ram Sarkar
- Mita Nasipuri
- Gaofeng Meng
- Jonathan J. Hull
- Gaurav Harit
- Anil K. Jain
- Gerd Maderlechner
- Seiichi Uchida
- Dan S. Bloomberg
- Ajoy Mondal
Venues
- CoRR
- ICDAR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICPR
- Int. J. Document Anal. Recognit.
- ICIP
- IEEE Trans. Image Process.
- IEEE Access
- MVA
- Remote. Sens.
- ICASSP
- ICFHR
- Document Analysis Systems
- IEEE Trans. Pattern Anal. Mach. Intell.
- DRR
- Systems and Computers in Japan
- Sensors
- Image Vis. Comput.
- ICPR (2)
- J. Electronic Imaging
- Int. J. Pattern Recognit. Artif. Intell.
- Document Recognition
- IGARSS
- CVPR
- Multim. Tools Appl.
- Expert Syst. Appl.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Electron. Agric.
- ICIP (2)
- Comput. Vis. Graph. Image Process.
- BMVC
- GREC
- Medical Imaging: Image Processing
- DAS
- ICVGIP
- ICMV
- ACM Symposium on Document Engineering
- Pattern Anal. Appl.
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