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Experts
- Syed Saqib Bukhari
- Thomas M. Breuel
- Faisal Shafait
- Basilios Gatos
- C. V. Jawahar
- David S. Doermann
- Marcus Liwicki
- Josef Kittler
- Bhabatosh Chanda
- Sekhar Mandal
- Nam Ik Cho
- Chew Lim Tan
- Andreas Dengel
- Hyung Il Koo
- Venu Govindaraju
- Mohamed Cheriet
- Muhammad Zeshan Afzal
- Jun Sun
- Jihad El-Sana
- S. P. Chowdhury
- Its'hak Dinstein
- Mita Nasipuri
- Gaofeng Meng
- Ching Y. Suen
- Ioannis Pratikakis
- Ram Sarkar
- Gary E. Kopec
- Chunhong Pan
- Thierry Paquet
- P. Nagabhushan
- Jean-Marc Ogier
- Umapada Pal
- Nikolaos Stamatopoulos
- P. Shivakumara
- Stavros J. Perantonis
- G. Hemantha Kumar
- Robert M. Haralick
- Gady Agam
- Alfred M. Bruckstein
Venues
- CoRR
- ICDAR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICPR
- Int. J. Document Anal. Recognit.
- ICIP
- IEEE Trans. Image Process.
- IEEE Access
- Remote. Sens.
- MVA
- ICASSP
- ICFHR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Document Analysis Systems
- DRR
- Systems and Computers in Japan
- Sensors
- Image Vis. Comput.
- J. Electronic Imaging
- ICPR (2)
- Int. J. Pattern Recognit. Artif. Intell.
- Document Recognition
- IGARSS
- CVPR
- Multim. Tools Appl.
- Expert Syst. Appl.
- Comput. Electron. Agric.
- IEEE Geosci. Remote. Sens. Lett.
- ICIP (2)
- Comput. Vis. Graph. Image Process.
- BMVC
- DAS
- Medical Imaging: Image Processing
- GREC
- Pattern Anal. Appl.
- ACM Symposium on Document Engineering
- ICMV
- ICVGIP
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