C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design.
Hamed F. Dadgour
Vivek De
Kaustav Banerjee
Published in:
ICCAD (2008)
Keyphrases
</>
statistical modeling
circuit design
field effect transistors
statistical models
data mining
emerging trends
predictive modeling
steady state
high density
pervasive computing
digital circuits
social computing
design automation
intra class
advanced technologies
hand held devices