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Path Unselection for Path Delay Fault Test Generation.

Irith Pomeranz
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2023)
Keyphrases
  • test generation
  • shortest path
  • image processing
  • test cases
  • data sets
  • computer vision
  • case study
  • training data
  • relational databases
  • design automation