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Circuit-aware device reliability criteria methodology.
Jason T. Ryan
Lan Wei
Jason P. Campbell
Ricki G. Southwick
Kin P. Cheung
Anthony S. Oates
H.-S. Philip Wong
John Suehle
Published in:
ESSCIRC (2011)
Keyphrases
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high speed
semiconductor devices
selection criteria
multi criteria
circuit design
reliability analysis
field effect transistors
equivalent circuit
neural network
case study
steady state
highly reliable
digital circuits
power reduction