Serial Interfacing for Embedded-Memory Testing.

Benoit Nadeau-Dostie Allan Silburt Vinod K. Agarwal

Published in: IEEE Des. Test Comput. (1990)

Keyphrases

test set
memory requirements
embedded systems
limited memory
computer vision
image processing
test cases
computational power
computing power
low memory
dynamic random access memory
real time
memory capacity
memory footprint
memory size
random access
memory usage
software testing