Reliability monitoring of digital circuits by in situ timing measurement.
Nasim Pour AryanGeorg GeorgakosDoris Schmitt-LandsiedelPublished in: PATMOS (2013)
Keyphrases
- digital circuits
- model based diagnosis
- monitoring system
- data flow
- evolvable hardware
- real time
- data acquisition
- circuit design
- functional decomposition
- finite state machines
- reliability analysis
- highly reliable
- software aging
- decision diagrams
- health care
- decision support
- data warehouse
- evolutionary algorithm
- lower bound
- neural network