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A precision capacitance cell for measurement of thin film out-of-plane expansion. III. Conducting and semiconducting materials.
Chad R. Snyder
Frederick I. Mopsik
Published in:
IEEE Trans. Instrum. Meas. (2001)
Keyphrases
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thin film
high density
short circuit
high speed
high precision
solar cell
electron microscopy
multi layer
three dimensional
grain size
chemical vapor deposition
neural network
unit length