Unsupervised detection of surface defects: A two-step approach.
Jiwon ChoiChangick KimPublished in: ICIP (2012)
Keyphrases
- detection algorithm
- surface defects
- semi supervised
- surface inspection
- machine vision
- automatic detection
- detection rate
- object detection
- anomaly detection
- post processing
- unsupervised manner
- detection accuracy
- data driven
- event detection
- machine learning
- unsupervised learning
- false alarms
- vision system
- supervised learning
- high quality
- feature selection