A Novel Test Data Compression Scheme for SoCs Based on Block Merging and Compatibility.
Tiebin WuHengzhu LiuBotao ZhangPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2014)
Keyphrases
- test data
- compression scheme
- image compression
- compression ratio
- test cases
- data compression
- index table
- compression algorithm
- training data
- test set
- training set
- data sets
- entropy coding
- run length encoding
- search based testing
- training and test data
- text classification
- wavelet transform
- computer vision
- testing process
- databases
- bitstream
- subband
- machine learning
- database