An in-Array Build-In Self-Test Scheme for Embedded SRAM Array.

Feng Wei Xiaole Cui Sunrui Zhang

Published in: IEEE Trans. Circuits Syst. II Express Briefs (2024)

Keyphrases

random access memory
linear array
neural network
programmable logic
data sets
image segmentation
multiresolution
test cases
test data
focal plane
dynamic random access memory