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Protocol Conformance Test Generation Using Multiple UIO Sequences With Overlapping.

Bo YangHasan Ural
Published in: SIGCOMM (1990)
Keyphrases
  • test generation
  • test sequences
  • test cases
  • data sets
  • information systems
  • databases
  • lightweight
  • design automation
  • hidden markov models
  • computer vision
  • metadata
  • case study
  • open source
  • software testing
  • static analysis