Compensation of Scanner Creep and Hysteresis for AFM Nanomanipulation.

Babak Mokaberi Aristides A. G. Requicha

Published in: IEEE Trans Autom. Sci. Eng. (2008)

Keyphrases

atomic force microscopy
early stage
highly nonlinear
laser beam
hand held
multiscale
neural network
genetic algorithm
image segmentation
expert systems
user interface
phase transition
structured light
error diffusion