Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review.
Nicolas BroduschHendrix DemersRaynald GauvinPublished in: J. Imaging (2018)
Keyphrases
- scanning electron microscope
- acquired images
- electron microscopy
- electron microscope
- imaging devices
- ccd camera
- active illumination
- x ray
- focal plane
- single shot
- infrared
- imaging process
- imaging model
- image capture
- hand held
- image processing
- light intensity
- field of view
- signal processing
- optical properties
- vision system
- captured images
- transmission electron microscopy
- high resolution
- imaging systems
- medical imaging
- structure from motion
- motion blurred images
- image analysis
- camera calibration
- focal length
- three dimensional
- camera parameters
- computer vision
- image sensor
- digital camera
- cross section
- multiple cameras
- multi camera
- light field
- single viewpoint
- camera motion
- time of flight
- image acquisition
- surveillance system
- dynamic range
- multi view
- computational photography