On-chip reliability monitors for measuring circuit degradation.
John KeaneTony Tae-Hyoung KimXiaofei WangChris H. KimPublished in: Microelectron. Reliab. (2010)
Keyphrases
- high speed
- analog vlsi
- circuit design
- evolvable hardware
- chip design
- cmos technology
- power dissipation
- physical design
- micron cmos
- phase locked loop
- low power
- low cost
- nm technology
- digital circuits
- high density
- power consumption
- evolutionary algorithm
- genetic algorithm
- mixed signal
- single chip
- error detection
- vlsi implementation
- programmable logic
- low voltage
- electronic circuits