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$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability.
Dharmaray Nedalgi
Saroja V. Siddamal
Published in:
APCCAS (2021)
Keyphrases
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leakage current
silicon dioxide
keywords
text mining
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information retrieval
input output
web documents
free text
text data
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database systems
neural network
file system
string matching
reliability analysis
multiple input
field effect transistors