Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods.
Willem D. van DrielC. J. LiuG. Q. ZhangJ. H. J. JanssenRichard B. R. van SilfhoutM. A. J. van GilsLeo J. ErnstPublished in: Microelectron. Reliab. (2004)
Keyphrases
- database
- neural networks and support vector machines
- real world
- preprocessing
- data sets
- mathematical models
- qualitative and quantitative
- computational cost
- neural network
- significant improvement
- data mining techniques
- prediction accuracy
- machine learning methods
- multiscale
- face recognition
- monte carlo simulation
- introduce a general framework