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Synchro-Tokens: Eliminating Nondeterminism to Enable Chip-Level Test of Globally-Asynchronous Locally-Synchronous SoC?s.
Matthew W. Heath
Wayne P. Burleson
Ian G. Harris
Published in:
DATE (2004)
Keyphrases
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asynchronous communication
built in self test
low power
low cost
high speed
hardware and software
situation calculus
single chip
levels of abstraction
real time
statistical tests
test data
vlsi design
test cases
random access memory
analog vlsi
hardware software co design
evolutionary algorithm