Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores.
Li ChenXiaoliang BaiSujit DeyPublished in: J. Electron. Test. (2002)
Keyphrases
- processor core
- dynamic random access memory
- high speed
- level parallelism
- operating system
- single chip
- ibm power processor
- memory subsystem
- ibm zenterprise
- embedded processors
- low power
- multi core processors
- embedded systems
- functional verification
- low cost
- instruction set
- defect detection
- real time
- address space
- correlation analysis
- multithreading
- random access memory
- printed circuit boards
- input output
- test cases
- software development life cycle