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Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer.
Heesu Lee
Seungjin Hwang
Hong Jin Kong
Kyung Hee Hong
Tae Jun Yu
Published in:
Sensors (2024)
Keyphrases
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refractive index
white light
film thickness
photometric stereo
data fusion
surface normals
single view
image processing
multiscale
pairwise
segmentation algorithm
light source
lighting conditions
structured light
palmprint recognition