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On-chip generation of primary input sequences for multicycle functional broadside tests.

Irith Pomeranz
Published in: IET Comput. Digit. Tech. (2018)
Keyphrases
  • low cost
  • high speed
  • functional verification
  • hidden markov models
  • input data
  • real time
  • test cases
  • high density
  • single chip
  • sequence analysis
  • long sequences
  • data sets
  • physical design