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Optimizing SOC Test Resources using Dual Sequences.
Wei Zou
Chris Chu
Sudhakar M. Reddy
Irith Pomeranz
Published in:
VLSI-SOC (2003)
Keyphrases
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test sequences
limited resources
neural network
databases
machine learning
test data
hardware and software
hardware software co design
knowledge base
resource allocation
sequential patterns
genomic sequences
resource requirements