LOW RESOLUTION DEPTH
Experts
- Song Zhang
- Guy Godin
- Marcos Portabella
- David Langerman
- Dale Royer
- Soumyadip Sengupta
- Tomoo Ushio
- Alan D. George
- Thomas Ertl
- Rui Zhang
- Shanchuan Lin
- Guoxiang Liu
- Shing-Tung Yau
- Ad Stoffelen
- David Ferreira
- Rafael F. S. Caldeirinha
- Evi Zouganeli
- Tomoaki Mega
- Florian Frieß
- Hongguo Jia
- Ira Kemelmacher-Shlizerman
- Bing Yu
- Steven M. Seitz
- Anton Verhoef
- Tian Fang
- Flávia Dias Casagrande
- Andrey Ryabtsev
- J. Schröter
- Christian Le Provost
- Arshia Cont
- Ioan Filip
- Randal C. Burns
- S. Roland Drayson
- Guijie Liu
- Teng Xu
- Shengsheng Jiang
- Manfred F. Buchroithner
- Thierry Coduys
- Bruce G. Elmegreen
Venues
- IGARSS
- CoRR
- Remote. Sens.
- Sensors
- IEEE Trans. Geosci. Remote. Sens.
- CVPR
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Bioinform.
- NeuroImage
- J. Real Time Image Process.
- IEEE Trans. Instrum. Meas.
- ICIP
- ICRA
- IEEE Access
- SMC
- EUSIPCO
- Real-Time Image and Video Processing
- CBMS
- Image Vis. Comput.
- Comput. Graph.
- PECCS
- J. Sci. Comput.
- CVPR (2)
- SIGGRAPH ASIA Posters
- IEEE J. Solid State Circuits
- NEMS
- NIME
- IEEE VAST
- 3DV
- IECON
- ICS
- CVPR Workshops
- Comput. Sci. Eng.
- Frontiers Inf. Technol. Electron. Eng.
- Microelectron. Reliab.
- IEEE Trans. Signal Process.
- CW
- ECCV (21)
- Adv. Eng. Informatics
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