FACE DETECTION AND TRACKING
Experts
- Rama Chellappa
- Wen Gao
- Xiaoou Tang
- Thomas S. Huang
- A. Enis Çetin
- Nassir Navab
- Christian Theobalt
- B. Ugur Töreyin
- Stan Z. Li
- Eric Granger
- Shaohua Kevin Zhou
- Vishal M. Patel
- Christoph Busch
- Dag Johansen
- Nasser Kehtarnavaz
- Anil K. Jain
- Brian C. Lovell
- Tat-Seng Chua
- Changsheng Xu
- PÃ¥l Halvorsen
- Stefano Tubaro
- Hannes Fassold
- Hazem M. El-Bakry
- Carsten Griwodz
- Qingming Huang
- Larry S. Davis
- Andrew Zisserman
- Xindi Shang
- Gerhard Widmer
- HÃ¥kon Kvale Stensland
- Michael Zollhöfer
- Paolo Bestagini
- Zhen Lei
- Fabrizio Falchi
- Dan Zeng
- Alberto Del Bimbo
- Bastian Leibe
- J. Ross Beveridge
- Peter H. N. de With
Venues
- CoRR
- Sensors
- ICIP
- IEEE Access
- Multim. Tools Appl.
- CVPR
- AVSS
- ICME
- ICASSP
- IEEE Trans. Circuits Syst. Video Technol.
- CVPR Workshops
- ACM Multimedia
- J. Real Time Image Process.
- ICPR
- IROS
- EMBC
- ICCV
- Pattern Recognit. Lett.
- WACV
- SMC
- FG
- Comput. Electron. Agric.
- ICRA
- Remote. Sens.
- EUSIPCO
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Expert Syst. Appl.
- ITSC
- ISCAS
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Instrum. Meas.
- VCIP
- BMVC
- FUSION
- IJCNN
- IEEE Trans. Intell. Transp. Syst.
- ICCV Workshops
- IEEE Trans. Inf. Forensics Secur.
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