FACE DETECTION AND TRACKING
Experts
- Rama Chellappa
- Wen Gao
- Thomas S. Huang
- A. Enis Çetin
- Xiaoou Tang
- Vishal M. Patel
- Nassir Navab
- Eric Granger
- B. Ugur Töreyin
- Shaohua Kevin Zhou
- Christian Theobalt
- Stan Z. Li
- Changsheng Xu
- Tat-Seng Chua
- Anil K. Jain
- Christoph Busch
- Brian C. Lovell
- Pål Halvorsen
- Nasser Kehtarnavaz
- Dag Johansen
- Håkon Kvale Stensland
- Zhen Lei
- Michael Zollhöfer
- Fabrizio Falchi
- Hannes Fassold
- Gerhard Widmer
- Larry S. Davis
- Xindi Shang
- Carsten Griwodz
- Qingming Huang
- Paolo Bestagini
- Hazem M. El-Bakry
- Stefano Tubaro
- Andrew Zisserman
- Dong Wang
- Shuo Yang
- Bernt Schiele
- Bastian Leibe
- Claudio Gennaro
Venues
- CoRR
- Sensors
- ICIP
- IEEE Access
- Multim. Tools Appl.
- CVPR
- AVSS
- ICME
- ICASSP
- CVPR Workshops
- ACM Multimedia
- IEEE Trans. Circuits Syst. Video Technol.
- EMBC
- J. Real Time Image Process.
- IROS
- ICPR
- ICCV
- WACV
- SMC
- FG
- Pattern Recognit. Lett.
- ICRA
- Comput. Electron. Agric.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- EUSIPCO
- ITSC
- IEEE Trans. Geosci. Remote. Sens.
- Pattern Recognit.
- IEEE Trans. Instrum. Meas.
- VCIP
- FUSION
- ICCV Workshops
- ISCAS
- IEEE Trans. Intell. Transp. Syst.
- BMVC
- IJCNN
- IEEE Trans. Inf. Forensics Secur.
- ROBIO
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