FACE DETECTION AND TRACKING
Experts
- Rama Chellappa
- Wen Gao
- Xiaoou Tang
- A. Enis Çetin
- Thomas S. Huang
- B. Ugur Töreyin
- Shaohua Kevin Zhou
- Stan Z. Li
- Christian Theobalt
- Vishal M. Patel
- Nassir Navab
- Eric Granger
- Brian C. Lovell
- Tat-Seng Chua
- Anil K. Jain
- Changsheng Xu
- Nasser Kehtarnavaz
- Christoph Busch
- Dag Johansen
- PÃ¥l Halvorsen
- Xindi Shang
- Zhen Lei
- Qingming Huang
- Gerhard Widmer
- Larry S. Davis
- Andrew Zisserman
- Carsten Griwodz
- Fabrizio Falchi
- Michael Zollhöfer
- HÃ¥kon Kvale Stensland
- Paolo Bestagini
- Hazem M. El-Bakry
- Stefano Tubaro
- Hannes Fassold
- Shuo Yang
- Alois C. Knoll
- Vamsidhar Reddy Gaddam
- Xilin Chen
- Shiguang Shan
Venues
- CoRR
- Sensors
- ICIP
- IEEE Access
- Multim. Tools Appl.
- CVPR
- AVSS
- ICME
- IEEE Trans. Circuits Syst. Video Technol.
- ICASSP
- CVPR Workshops
- J. Real Time Image Process.
- ACM Multimedia
- IROS
- ICPR
- EMBC
- ICCV
- Pattern Recognit. Lett.
- WACV
- FG
- SMC
- Comput. Electron. Agric.
- ICRA
- Remote. Sens.
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- ITSC
- EUSIPCO
- IEEE Trans. Geosci. Remote. Sens.
- ISCAS
- IEEE Trans. Instrum. Meas.
- VCIP
- FUSION
- ICCV Workshops
- IEEE Trans. Inf. Forensics Secur.
- IJCNN
- BMVC
- IEEE Trans. Intell. Transp. Syst.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend