FACE DETECTION AND TRACKING
Experts
- Rama Chellappa
- Wen Gao
- Xiaoou Tang
- A. Enis Çetin
- Thomas S. Huang
- Vishal M. Patel
- Stan Z. Li
- Shaohua Kevin Zhou
- Christian Theobalt
- Eric Granger
- Nassir Navab
- B. Ugur Töreyin
- Nasser Kehtarnavaz
- Tat-Seng Chua
- Christoph Busch
- Changsheng Xu
- Brian C. Lovell
- Dag Johansen
- Anil K. Jain
- Pål Halvorsen
- Hazem M. El-Bakry
- Carsten Griwodz
- Hannes Fassold
- Håkon Kvale Stensland
- Gerhard Widmer
- Stefano Tubaro
- Paolo Bestagini
- Larry S. Davis
- Andrew Zisserman
- Michael Zollhöfer
- Qingming Huang
- Xindi Shang
- Fabrizio Falchi
- Zhen Lei
- Peter H. N. de With
- Bernt Schiele
- Bastian Leibe
- Gérard G. Medioni
- Modesto Castrillón Santana
Venues
- CoRR
- Sensors
- ICIP
- IEEE Access
- Multim. Tools Appl.
- CVPR
- AVSS
- ICME
- IEEE Trans. Circuits Syst. Video Technol.
- ICASSP
- CVPR Workshops
- J. Real Time Image Process.
- ACM Multimedia
- ICPR
- IROS
- EMBC
- ICCV
- Pattern Recognit. Lett.
- WACV
- SMC
- FG
- ICRA
- Comput. Electron. Agric.
- Remote. Sens.
- ITSC
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Expert Syst. Appl.
- EUSIPCO
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Instrum. Meas.
- ISCAS
- VCIP
- IEEE Trans. Intell. Transp. Syst.
- IJCNN
- FUSION
- ICCV Workshops
- IEEE Trans. Inf. Forensics Secur.
- BMVC
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