FACE DETECTION AND TRACKING
Experts
- Rama Chellappa
- Wen Gao
- Xiaoou Tang
- A. Enis Çetin
- Thomas S. Huang
- Shaohua Kevin Zhou
- Stan Z. Li
- Vishal M. Patel
- Eric Granger
- B. Ugur Töreyin
- Nassir Navab
- Christian Theobalt
- Changsheng Xu
- Brian C. Lovell
- Christoph Busch
- Tat-Seng Chua
- Nasser Kehtarnavaz
- Anil K. Jain
- Pål Halvorsen
- Dag Johansen
- Larry S. Davis
- Paolo Bestagini
- Stefano Tubaro
- Andrew Zisserman
- Håkon Kvale Stensland
- Carsten Griwodz
- Hannes Fassold
- Hazem M. El-Bakry
- Gerhard Widmer
- Fabrizio Falchi
- Zhen Lei
- Xindi Shang
- Michael Zollhöfer
- Qingming Huang
- Philip H. S. Torr
- Ioannis Pitas
- Dong Wang
- Gérard G. Medioni
- Modesto Castrillón Santana
Venues
- CoRR
- Sensors
- ICIP
- IEEE Access
- Multim. Tools Appl.
- CVPR
- AVSS
- ICME
- IEEE Trans. Circuits Syst. Video Technol.
- ICASSP
- CVPR Workshops
- ACM Multimedia
- J. Real Time Image Process.
- ICPR
- EMBC
- IROS
- ICCV
- Pattern Recognit. Lett.
- WACV
- SMC
- FG
- ICRA
- Comput. Electron. Agric.
- Remote. Sens.
- ITSC
- EUSIPCO
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Geosci. Remote. Sens.
- ISCAS
- VCIP
- FUSION
- IEEE Trans. Intell. Transp. Syst.
- IJCNN
- BMVC
- IEEE Trans. Inf. Forensics Secur.
- ICCV Workshops
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