DENSE SAMPLING
Experts
- Moncef Gabbouj
- Martin Vetterli
- Alexandros Iosifidis
- Anastasios Tefas
- Ayush Bhandari
- Nikolaos Passalis
- Felix Krahmer
- Andrew J. Davison
- Jenni Raitoharju
- Ramesh Raskar
- Matthew A. Prelee
- Yonina C. Eldar
- David L. Neuhoff
- Volker Pohl
- Amitabha Bagchi
- Feng Xi
- David Francis Walnut
- Shengyao Chen
- André Kaup
- Holger Boche
- Cordelia Schmid
- Suling Zhang
- Srikanta Bedathur
- Neha Sengupta
- Zhong Liu
- Sundeep Prabhakar Chepuri
- Jürgen Seiler
- Maya Ramanath
- Hervé Jégou
- Bede Liu
- Yunji Chen
- Hanshen Xiao
- Minhoo Kang
- Jiexiong Tang
- Patric Jensfelt
- Raluca Scona
- Jan Czarnowski
- Yasuo Kuniyoshi
- Christoph Beierle
Venues
- CoRR
- ICASSP
- IEEE Trans. Signal Process.
- ICIP
- ICPR
- Neurocomputing
- EUSIPCO
- IEEE Trans. Inf. Theory
- GlobalSIP
- IEEE Signal Process. Lett.
- IROS
- ACM Multimedia
- HPCA
- CVPR
- Sensors
- IEICE Trans. Inf. Syst.
- Evol. Intell.
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Access
- IEEE Trans. Geosci. Remote. Sens.
- IEEE J. Biomed. Health Informatics
- IEEE Robotics Autom. Lett.
- IEEE Trans. Vis. Comput. Graph.
- IET Comput. Vis.
- ACM Trans. Graph.
- IEEE Trans. Very Large Scale Integr. Syst.
- ISBI
- IEEE Trans. Knowl. Data Eng.
- Comput. Graph. Forum
- Vis. Comput.
- Int. J. Comput. Vis.
- VISAPP (1)
- MICCAI (1)
- CIVR
- ICIMCS
- ICIG
- VCIP
- Expert Syst. Appl.
- Multim. Tools Appl.
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