CUSTOMER CHURN
Experts
- Dirk Van den Poel
- Bart Baesens
- Sajid Anwar
- Adnan Amin
- Wouter Verbeke
- Nicholas C. Romano Jr.
- Jerry Fjermestad
- Kristof Coussement
- Koen W. De Bock
- Rainer Alt
- Bing Quan Huang
- Alan D. Smith
- Asifullah Khan
- David C. Yen
- M. Tahar Kechadi
- Adnan Idris
- Yanbo J. Wang
- Brian Buckley
- Seppe vanden Broucke
- Vadlamani Ravi
- Lutz M. Kolbe
- Abbas Keramati
- Babar Shah
- Eugen Stripling
- MarÃa Óskarsdóttir
- David Martens
- Shan Ling Pan
- Changez Khan
- Jan Vanthienen
- Tommi Laukkanen
- Juan Lei
- Jiayin Qi
- Junlin Zeng
- Xiu Li
- Jaideep Srivastava
- Xianquan Zhang
- Walter Brenner
- Olaf Reinhold
- Yeon Soo Lee
Venues
- CoRR
- Expert Syst. Appl.
- IEEE Access
- HICSS
- Eur. J. Oper. Res.
- Remote. Sens.
- ECIS
- PACIS
- AMCIS
- Neural Comput. Appl.
- Decis. Support Syst.
- Multim. Tools Appl.
- Bus. Process. Manag. J.
- HMD Prax. Wirtsch.
- SIU
- Int. J. Bus. Inf. Syst.
- ITSC
- Int. J. Inf. Manag.
- SMC
- Sensors
- ASONAM
- J. Intell. Fuzzy Syst.
- EMBC
- ICDM Workshops
- Int. J. E Bus. Res.
- Eng. Appl. Artif. Intell.
- Int. J. Mob. Commun.
- Inf. Manag.
- IEEE BigData
- Electron. Mark.
- Mark. Sci.
- Inf.
- Kybernetes
- J. Theor. Appl. Electron. Commer. Res.
- Ind. Manag. Data Syst.
- Manag. Sci.
- Appl. Soft Comput.
- Entropy
- J. Big Data
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