CUSTOMER CHURN
Experts
- Dirk Van den Poel
- Bart Baesens
- Sajid Anwar
- Adnan Amin
- Jerry Fjermestad
- Nicholas C. Romano Jr.
- Wouter Verbeke
- Kristof Coussement
- Koen W. De Bock
- Rainer Alt
- Alan D. Smith
- Bing Quan Huang
- Seppe vanden Broucke
- M. Tahar Kechadi
- Vadlamani Ravi
- Yanbo J. Wang
- Asifullah Khan
- Adnan Idris
- Brian Buckley
- David C. Yen
- Babar Shah
- Jiayin Qi
- Jan Vanthienen
- María Óskarsdóttir
- Lutz M. Kolbe
- Abbas Keramati
- Changez Khan
- David Martens
- Eugen Stripling
- Tommi Laukkanen
- Juan Lei
- Shan Ling Pan
- Arno De Caigny
- Ting Huang
- Junlin Zeng
- Chih-Fong Tsai
- Christopher Bull
- Imtiaz Ali
- Yeon Soo Lee
Venues
- CoRR
- Expert Syst. Appl.
- IEEE Access
- HICSS
- Eur. J. Oper. Res.
- ECIS
- Remote. Sens.
- PACIS
- Neural Comput. Appl.
- AMCIS
- Multim. Tools Appl.
- Decis. Support Syst.
- Bus. Process. Manag. J.
- SIU
- HMD Prax. Wirtsch.
- Int. J. Bus. Inf. Syst.
- Sensors
- ASONAM
- Int. J. Inf. Manag.
- SMC
- ITSC
- J. Intell. Fuzzy Syst.
- Eng. Appl. Artif. Intell.
- Mark. Sci.
- Int. J. Mob. Commun.
- Electron. Mark.
- Inf. Manag.
- ICDM Workshops
- EMBC
- IEEE BigData
- Int. J. E Bus. Res.
- Inf.
- Ind. Manag. Data Syst.
- Kybernetes
- J. Theor. Appl. Electron. Commer. Res.
- Entropy
- Appl. Soft Comput.
- Manag. Sci.
- IJCNN
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