CUSTOMER CHURN
Experts
- Dirk Van den Poel
- Bart Baesens
- Adnan Amin
- Sajid Anwar
- Jerry Fjermestad
- Nicholas C. Romano Jr.
- Wouter Verbeke
- Kristof Coussement
- Koen W. De Bock
- Rainer Alt
- Bing Quan Huang
- Alan D. Smith
- Brian Buckley
- M. Tahar Kechadi
- Vadlamani Ravi
- Seppe vanden Broucke
- Yanbo J. Wang
- David C. Yen
- Asifullah Khan
- Adnan Idris
- Tommi Laukkanen
- Lutz M. Kolbe
- David Martens
- Abbas Keramati
- Eugen Stripling
- Jiayin Qi
- Babar Shah
- María Óskarsdóttir
- Shan Ling Pan
- Jan Vanthienen
- Juan Lei
- Changez Khan
- Michael Burch
- Wanshan Yang
- Xianquan Zhang
- Carlos Sarraute
- Marianna Sigala
- Konrad Walser
- Arno De Caigny
Venues
- CoRR
- Expert Syst. Appl.
- IEEE Access
- HICSS
- Eur. J. Oper. Res.
- ECIS
- Remote. Sens.
- Neural Comput. Appl.
- AMCIS
- PACIS
- Bus. Process. Manag. J.
- Decis. Support Syst.
- Multim. Tools Appl.
- HMD Prax. Wirtsch.
- ITSC
- SMC
- SIU
- Int. J. Inf. Manag.
- ASONAM
- Int. J. Mob. Commun.
- Inf. Manag.
- Int. J. Bus. Inf. Syst.
- Mark. Sci.
- Int. J. E Bus. Res.
- ICDM Workshops
- EMBC
- Electron. Mark.
- IEEE BigData
- Appl. Soft Comput.
- Inf.
- J. Intell. Fuzzy Syst.
- Manag. Sci.
- Kybernetes
- Entropy
- Ind. Manag. Data Syst.
- J. Theor. Appl. Electron. Commer. Res.
- IJCNN
- Sensors
- ICCTA
Related Topics
Related Keywords
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