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Experts
- Haitao Wang
- Csaba D. Tóth
- Sandip Das
- Sasanka Roy
- Arindam Karmakar
- Qian Chen
- Eunjin Oh
- Yuncai Liu
- Xiaochun Cao
- Ovidiu Daescu
- Hassan Foroosh
- Hee-Kap Ahn
- Jack Brimberg
- Haiyuan Wu
- John Illingworth
- Ryuuki Sakamoto
- Subhas C. Nandy
- Zijian Zhao
- Jiqing Chen
- Marc Van Droogenbroeck
- Yoshihiro Kawai
- Miranda Krekovic
- Ali A. Al-Sharadqah
- Brendan P. Byrne
- Hu Qiang
- Manjanna Basappa
- Anita Schöbel
- Wan-Chi Siu
- Hyowon Ha
- Guanwen Xu
- Neeldhara Misra
- Pierre Gurdjos
- Zhanyi Hu
- Xuechun Wang
- Henrik Juel
- Fengli Yang
- Hiroyasu Koshimizu
- Aditi Sethia
- Nicolás Guil
Venues
- CoRR
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- ICPR
- CVPR
- ICCV
- Pattern Recognit.
- Discret. Appl. Math.
- Discret. Comput. Geom.
- Comput. Geom.
- CCCG
- ICPR (1)
- Sensors
- BMVC
- Comput. Vis. Image Underst.
- MVA
- IGARSS
- Am. Math. Mon.
- ICPR (2)
- Image Vis. Comput.
- Mach. Vis. Appl.
- IEEE Trans. Instrum. Meas.
- ICASSP
- IROS
- ICRA
- FUSION
- Symmetry
- Eur. J. Comb.
- J. Math. Imaging Vis.
- ECCV (4)
- VISAPP (1)
- Signal Process.
- Inf. Process. Lett.
- ICAPR
- Int. J. Pattern Recognit. Artif. Intell.
- Comput. Electron. Agric.
- ICIG
- SIAM J. Discret. Math.
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