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Experts
- Isabelle Bloch
- Jesús Angulo
- Robert M. Haralick
- Laurent Najman
- Setrag Khoshafian
- Henk J. A. M. Heijmans
- Tatsuo Tsuji
- Francisco Ortiz
- Marcos Eduardo Valle
- Harald Schöning
- Cris L. Luengo Hendriks
- Pedro Pina
- Jean Cousty
- Leonid M. Fridman
- Jamal Atif
- Alain Bretto
- Santiago Velasco-Forero
- Peter Sussner
- Venkatesan Guruswami
- Henk M. Blanken
- Matthew J. Thurley
- Adam D. Smith
- Junior Barrera
- Edward R. Dougherty
- Serge Abiteboul
- B. S. Daya Sagar
- Abdelhak M. Zoubir
- Stéphane Grumbach
- John C. Handley
- Pierre Soille
- Teo Asplund
- Michel E. Adiba
- Dan Suciu
- Teruhisa Hochin
- Jean Serra
- Jos B. T. M. Roerdink
- George P. Copeland
- Dagmar Sternad
- Lois M. L. Delcambre
Venues
- ISMM
- CoRR
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- ICIP
- ICASSP
- ICPR
- Signal Process.
- Data Knowl. Eng.
- Systems and Computers in Japan
- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- J. Math. Imaging Vis.
- J. Vis. Commun. Image Represent.
- EDBT
- ICRA
- IEEE Trans. Signal Process.
- PODS
- EUSFLAT Conf.
- DBPL
- IEEE Access
- EUSIPCO
- VLDB
- Image Vis. Comput.
- IEEE Signal Process. Lett.
- Inf. Sci.
- SIGMOD Conference
- CIARP
- Math. Morphol. Theory Appl.
- DOOD
- Multim. Tools Appl.
- ICDE
- ICIP (2)
- Comput. Aided Des.
- CDC
- IEEE Trans. Instrum. Meas.
- ISMM (2)
- WILF
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