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Experts
- Isabelle Bloch
- Jesús Angulo
- Robert M. Haralick
- Laurent Najman
- Henk J. A. M. Heijmans
- Setrag Khoshafian
- Pedro Pina
- Francisco Ortiz
- Marcos Eduardo Valle
- Cris L. Luengo Hendriks
- Harald Schöning
- Tatsuo Tsuji
- B. S. Daya Sagar
- Adam D. Smith
- Edward R. Dougherty
- Henk M. Blanken
- Serge Abiteboul
- Matthew J. Thurley
- Peter Sussner
- Alain Bretto
- Abdelhak M. Zoubir
- Jean Cousty
- Jamal Atif
- Venkatesan Guruswami
- Santiago Velasco-Forero
- Junior Barrera
- Leonid M. Fridman
- Kazuhiro Ogura
- Fernando Torres Medina
- Teo Asplund
- Ken Higuchi
- Robin Strand
- Wouter B. Teeuw
- Wilfried Philips
- Takeshi Horie
- Jos B. T. M. Roerdink
- John C. Handley
- Scott Britell
- George P. Copeland
Venues
- ISMM
- CoRR
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- ICASSP
- ICIP
- ICPR
- Data Knowl. Eng.
- Signal Process.
- Systems and Computers in Japan
- J. Vis. Commun. Image Represent.
- IEEE Trans. Geosci. Remote. Sens.
- J. Math. Imaging Vis.
- EDBT
- Pattern Recognit.
- IGARSS
- ICRA
- EUSFLAT Conf.
- EUSIPCO
- DBPL
- IEEE Access
- VLDB
- IEEE Trans. Signal Process.
- PODS
- Multim. Tools Appl.
- SIGMOD Conference
- SIBGRAPI
- Sensors
- ICDE
- Math. Morphol. Theory Appl.
- IROS
- WILF
- IEEE Signal Process. Lett.
- IEEE Trans. Instrum. Meas.
- ISMM (2)
- CIARP
- IEEE Trans. Smart Grid
- Image Vis. Comput.
- Inf. Sci.
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