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Experts
- Isabelle Bloch
- Jesús Angulo
- Robert M. Haralick
- Laurent Najman
- Henk J. A. M. Heijmans
- Setrag Khoshafian
- Marcos Eduardo Valle
- Francisco Ortiz
- Pedro Pina
- Tatsuo Tsuji
- Harald Schöning
- Cris L. Luengo Hendriks
- Adam D. Smith
- Henk M. Blanken
- Matthew J. Thurley
- Venkatesan Guruswami
- Edward R. Dougherty
- Abdelhak M. Zoubir
- Santiago Velasco-Forero
- Junior Barrera
- B. S. Daya Sagar
- Serge Abiteboul
- Leonid M. Fridman
- Jamal Atif
- Alain Bretto
- Jean Cousty
- Peter Sussner
- Richard Furuta
- Toyohisa Kaneko
- Jean Serra
- Teo Asplund
- John C. Handley
- Lillian N. Cassel
- Lois M. L. Delcambre
- Alessandro Ledda
- Guillaume Noyel
- Stéphane Grumbach
- Michel E. Adiba
- Marie-Jeanne Lesot
Venues
- ISMM
- CoRR
- Pattern Recognit. Lett.
- ICIP
- ICASSP
- IEEE Trans. Image Process.
- ICPR
- Data Knowl. Eng.
- Signal Process.
- Systems and Computers in Japan
- J. Vis. Commun. Image Represent.
- Pattern Recognit.
- ICRA
- J. Math. Imaging Vis.
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- EDBT
- PODS
- EUSIPCO
- IEEE Access
- VLDB
- EUSFLAT Conf.
- DBPL
- IEEE Trans. Signal Process.
- IEEE Trans. Instrum. Meas.
- CIARP
- IROS
- ICIP (2)
- ISMM (2)
- Image Vis. Comput.
- Sensors
- Comput. Aided Des.
- SIGMOD Conference
- IEEE Trans. Smart Grid
- ICDE
- Multim. Tools Appl.
- IEEE Signal Process. Lett.
- Math. Morphol. Theory Appl.
- WILF
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