AFFINE TRANSFORM
Experts
- Madhu Sudan
- Thomas W. Cusick
- Janne Heikkilä
- Toru Wakahara
- Eli Ben-Sasson
- Jeng-Shyang Pan
- Arnab Bhattacharyya
- Jezekiel Ben-Arie
- Kancharagunta Kishan Babu
- Alan Guo
- Jean-Michel Morel
- Shiv Ram Dubey
- Pantelimon Stanica
- Zhiqian Wang
- Gregory Schwartzman
- Reuven Bar-Yehuda
- Keren Censor-Hillel
- Liming Zhang
- Ilya V. Kolmanovsky
- Xuming Huang
- Younhwan Cheon
- Pulak Mondal
- David Brie
- Esa Rahtu
- Andrew Zisserman
- Noga Ron-Zewi
- Sivakanth Gopi
- Hossein Rastgoftar
- Mikko Salo
- James M. Murphy
- Jan Flusser
- Luca Lucchese
- Dacheng Tao
- Swapna Banerjee
- Kanat S. Abdukhalikov
- Hongfu Sun
- Yicheng Pan
- Chang Tang
- Yu Chen
Venues
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- IGARSS
- Pattern Recognit.
- ICIP
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- ICPR
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Comput. Vis. Image Underst.
- Electron. Colloquium Comput. Complex.
- IEEE Trans. Inf. Theory
- IEEE Trans. Image Process.
- FOCS
- Pattern Recognit. Lett.
- Comput. Aided Geom. Des.
- Sensors
- ICIC (1)
- Inf. Sci.
- BMVC
- Des. Codes Cryptogr.
- IST
- J. Electronic Imaging
- SIAM J. Imaging Sci.
- Expert Syst. Appl.
- ICCV
- Appl. Math. Comput.
- Image Vis. Comput.
- ICPR (1)
- IEEE Geosci. Remote. Sens. Lett.
- CVPR
- ICDAR
- J. Vis. Commun. Image Represent.
- ICIP (1)
- J. VLSI Signal Process.
- IEEE Access
- ICIP (2)
- Vis. Comput.
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