Yonsang Cho

Publication Activity (10 Years)

Years Active: 2004-2022
Publications (10 Years): 1

Top Topics

Parallel Search

Fault Tolerance

Top Venues

Publications

Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas
Multi-die Parallel Test Fabric for Scalability and Pattern Reusability. ITC (2022)
Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy
On reducing test application time for scan circuits using limited scan operations and transfer sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24 (10) (2005)
Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy
Test Application Time Reduction for Scan Circuits Using Limited Scan Operations. ISQED (2004)