Multi-die Parallel Test Fabric for Scalability and Pattern Reusability.

Arani Sinha Yonsang Cho Jon Easter Meizel V. Leiva Rojas

Published in: ITC (2022)

Keyphrases

parallel implementation
pattern matching
test data
parallel processing
parallel search
real time
case study
feature extraction
data structure
fault tolerance
design patterns
distributed memory
parallel execution
pc cluster
level parallelism