YiFeng Wu

Publication Activity (10 Years)

Years Active: 2002-2018
Publications (10 Years): 3

Top Topics

Service Quality

Software Reliability

Energy Dissipation

Top Venues

Microelectron. Reliab.

Publications

Primit Parikh, YiFeng Wu, Likun Shen, John Gritters, Tsutomu Hosoda, Ronald Barr, Kurt Smith, Ken Shono, J. McKay, H. Clement, Saurabh Chowdhury, S. Yea, Peter Smith, Lee McCarthy, R. Birkhahn, P. Zuk, Yoshimori Asai
650 Volt GaN: Highest Quality-Highest Performance Drives Market Ramp. BCICTS (2018)
K. V. Smith, J. Haller, Josep M. Guerrero, R. P. Smith, R. Lal, YiFeng Wu
Lifetime tests of 600-V GaN-on-Si power switches and HEMTs. Microelectron. Reliab. 58 (2016)
Toshihide Kikkawa, Tsutomu Hosoda, Ken Shono, Kenji Imanishi, Yoshimori Asai, YiFeng Wu, Likun Shen, Kurt Smith, Dixie Dunn, Saurabh Chowdhury, Peter Smith, John Gritters, Lee McCarthy, Ronald Barr, Rakesh Lal, Umesh K. Mishra, Primit Parikh
Commercialization and reliability of 600 V GaN power switches. IRPS (2015)
Umesh K. Mishra, Likun Shen, Thomas E. Kazior, YiFeng Wu
GaN-Based RF Power Devices and Amplifiers. Proc. IEEE 96 (2) (2008)
Umesh K. Mishra, Primit Parikh, YiFeng Wu
AlGaN/GaN HEMTs-an overview of device operation and applications. Proc. IEEE 90 (6) (2002)