Lifetime tests of 600-V GaN-on-Si power switches and HEMTs.

K. V. Smith J. Haller Josep M. Guerrero R. P. Smith R. Lal YiFeng Wu

Published in: Microelectron. Reliab. (2016)

Keyphrases

power consumption
energy consumption
power distribution
battery powered
database
neural network
machine learning
genetic algorithm
image processing
statistical tests
data gathering
total energy
energy dissipation