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Yider Wu
Publication Activity (10 Years)
Years Active: 2004-2004
Publications (10 Years): 0
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Publications
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Yi-Mu Lee
,
Yider Wu
,
Gerald Lucovsky
Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress.
Microelectron. Reliab.
44 (2) (2004)