Yi-Mu Lee

Publication Activity (10 Years)

Years Active: 2004-2004
Publications (10 Years): 0

Publications

Yi-Mu Lee, Yider Wu, Gerald Lucovsky
Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress. Microelectron. Reliab. 44 (2) (2004)