Yanfeng Albert Li

Publication Activity (10 Years)

Years Active: 2012-2012
Publications (10 Years): 0

Top Topics

Wireless Communication

Metal Oxide Semiconductor

Delay Insensitive

Top Venues

Microelectron. Reliab.

Publications

Nadia Rezzak, Pierre Maillard, Ronald D. Schrimpf, Michael L. Alles, Daniel M. Fleetwood, Yanfeng Albert Li
The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies. Microelectron. Reliab. 52 (11) (2012)