Wu-Le Zhu

Publication Activity (10 Years)

Years Active: 2017-2023
Publications (10 Years): 10

Top Topics

Top Venues

IEEE Trans. Ind. Electron.

IEEE Trans. Ind. Informatics

IEEE Trans Autom. Sci. Eng.

Publications

Wen-Hao Zhang, Lin Dai, Wang Chen, Anyu Sun, Wu-Le Zhu, Bing-Feng Ju
Novel Information-Driven Smoothing Spline Linearization Method for High-Precision Displacement Sensors Based on Information Criterions. Sensors 23 (22) (2023)
Li Chen, Yuhan Niu, Xu Yang, Wu-Le Zhu, Li-Min Zhu, Zhiwei Zhu
A Novel Compliant Nanopositioning Stage Driven by a Normal-Stressed Electromagnetic Actuator. IEEE Trans Autom. Sci. Eng. 19 (4) (2022)
Zhiwei Zhu, Li Chen, Peng Huang, Lars Schönemann, Oltmann Riemer, Jianyong Yao, Suet To, Wu-Le Zhu
Design and Control of a Piezoelectrically Actuated Fast Tool Servo for Diamond Turning of Microstructured Surfaces. IEEE Trans. Ind. Electron. 67 (8) (2020)
Xu Yang, Wu-Le Zhu
Design, Analysis, and Control of an XY Parallel Nanomanipulator With Multiple Actuation Modes. IEEE Trans. Ind. Electron. 67 (9) (2020)
Zhiwei Zhu, Hanheng Du, Rongjing Zhou, Peng Huang, Wu-Le Zhu, Ping Guo
Design and Trajectory Tracking of a Nanometric Ultra-Fast Tool Servo. IEEE Trans. Ind. Electron. 67 (1) (2020)
Xu Yang, Wu-Le Zhu
Design, Analysis, and Test of a Novel Self-Sensing Fast Tool Servo. IEEE Trans. Ind. Informatics 16 (7) (2020)
Wu-Le Zhu, Xu Yang, Zhiwei Zhu
Development of a Highly Flexible Lattice-Structure-Based Force Sensing Mechanism. IEEE Trans. Ind. Informatics 15 (11) (2019)
Wu-Le Zhu, Xu Yang, Fang Duan, Zhiwei Zhu, Bing-Feng Ju
Design and Adaptive Terminal Sliding Mode Control of a Fast Tool Servo System for Diamond Machining of Freeform Surfaces. IEEE Trans. Ind. Electron. 66 (6) (2019)
Zhiwei Zhu, Suet To, Wu-Le Zhu, Yangmin Li, Peng Huang
Optimum Design of a Piezo-Actuated Triaxial Compliant Mechanism for Nanocutting. IEEE Trans. Ind. Electron. 65 (8) (2018)
Shizhen Li, Jianhua Wei, Kai Guo, Wu-Le Zhu
Nonlinear Robust Prediction Control of Hybrid Active-Passive Heave Compensator With Extended Disturbance Observer. IEEE Trans. Ind. Electron. 64 (8) (2017)