Login / Signup
Wensuo Chen
ORCID
Publication Activity (10 Years)
Years Active: 2017-2024
Publications (10 Years): 9
Top Topics
Data Records
Surface Features
Precise Localization
Electron Microscope
Top Venues
Microelectron. J.
IEICE Electron. Express
Microelectron. Reliab.
IEICE Trans. Electron.
</>
Publications
</>
Hang Shu
,
Pengfei Liao
,
Haiqing Peng
,
Wensuo Chen
A transient-enhanced output-capacitorless LDO regulator with non-inverting pull-push gain stage.
Microelectron. J.
151 (2024)
Jiaweiwen Huang
,
Wensuo Chen
,
Shenglei Zhao
,
Qisheng Yu
,
Aohang Zhang
,
Kunfeng Zhu
,
Jian Li
Novel superjunction Fin-based NiO/β-Ga2O3 HJFET with additional surface drift region channels for record-high performance.
Microelectron. J.
151 (2024)
Qisheng Yu
,
Zhengyuan Zhang
,
Aohang Zhang
,
Jiaweiwen Huang
,
Wensuo Chen
Comprehensive experimental study on Schottky contact super barrier rectifier.
Microelectron. J.
144 (2024)
Peijian Zhang
,
Kunfeng Zhu
,
Wensuo Chen
A Novel Trench MOS Barrier Schottky Contact Super Barrier Rectifier.
IEICE Trans. Electron.
107 (1) (2024)
Yuying Wang
,
Zhengyuan Zhang
,
Peng Jian
,
Pengfei Liao
,
Aohang Zhang
,
Kunfeng Zhu
,
Wensuo Chen
Novel fast-switching P-poly trench collector reverse conducting IGBT with different N-buffer position.
Microelectron. J.
147 (2024)
Zhigang Shen
,
Pengfei Liao
,
Qisheng Yu
,
Jiaweiwen Huang
,
Aohang Zhang
,
Wensuo Chen
Design and investigation of double-RESURF SOI-LIGBT with carrier-storage layer in P-top.
Microelectron. J.
147 (2024)
Zhigang Shen
,
Wensuo Chen
Novel low loss dual-trench superjunction IGBT with semi-floating P-pillar.
Microelectron. J.
144 (2024)
Yuying Wang
,
Aohang Zhang
,
Peng Jian
,
Wensuo Chen
A snapback-free and fast-switching planar-gate SOI LIGBT with three electron extracting channels.
IEICE Electron. Express
19 (16) (2022)
Peijian Zhang
,
Xue Wu
,
Qianning Yi
,
Wensuo Chen
,
Yonghui Yang
,
Kunfeng Zhu
,
Kaizhou Tan
,
Yi Zhong
A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels.
Microelectron. Reliab.
71 (2017)