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A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels.

Peijian ZhangXue WuQianning YiWensuo ChenYonghui YangKunfeng ZhuKaizhou TanYi Zhong
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • high density
  • field effect transistors
  • real time
  • data mining
  • genetic algorithm
  • information systems
  • positive and negative
  • circuit design