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Wei Zhang
Publication Activity (10 Years)
Years Active: 2009-2013
Publications (10 Years): 0
Top Topics
Low Power
Digital Signal Processing
Embedded Dram
Random Access Memory
Top Venues
IEEE Trans. Circuits Syst. I Regul. Pap.
CICC
IEEE J. Solid State Circuits
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Publications
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Wei Zhang
,
Ki Chul Chun
,
Chris H. Kim
A Write-Back-Free 2T1D Embedded DRAM With Local Voltage Sensing and a Dual-Row-Access Low Power Mode.
IEEE Trans. Circuits Syst. I Regul. Pap.
(8) (2013)
Wei Zhang
,
Ki Chul Chun
,
Chris H. Kim
A write-back-free 2T1D embedded DRAM with local voltage sensing and a dual-row-access low power mode.
CICC
(2012)
Ki Chul Chun
,
Wei Zhang
,
Pulkit Jain
,
Chris H. Kim
A 2T1C Embedded DRAM Macro With No Boosted Supplies Featuring a 7T SRAM Based Repair and a Cell Storage Monitor.
IEEE J. Solid State Circuits
47 (10) (2012)
Tony Tae-Hyoung Kim
,
Wei Zhang
,
Chris H. Kim
Degradation.
IEEE Trans. Circuits Syst. I Regul. Pap.
(3) (2012)
Ki Chul Chun
,
Wei Zhang
,
Pulkit Jain
,
Chris H. Kim
A 700MHz 2T1C embedded DRAM macro in a generic logic process with no boosted supplies.
ISSCC
(2011)
Wei Zhang
,
Mingjing Ha
,
Daniele Braga
,
Michael J. Renn
,
C. Daniel Frisbie
,
Chris H. Kim
A 1V printed organic DRAM cell based on ion-gel gated transistors with a sub-10nW-per-cell Refresh Power.
ISSCC
(2011)
John Keane
,
Wei Zhang
,
Chris H. Kim
An Array-Based Odometer System for Statistically Significant Circuit Aging Characterization.
IEEE J. Solid State Circuits
46 (10) (2011)
Wei Zhang
,
Ki Chul Chun
,
Chris H. Kim
Variation aware performance analysis of gain cell embedded DRAMs.
ISLPED
(2010)
Tony Tae-Hyoung Kim
,
Wei Zhang
,
Chris H. Kim
An SRAM reliability test macro for fully-automated statistical measurements of Vmin degradation.
CICC
(2009)